Welcome to LLE

The Laboratory for Laser Energetics (LLE) of the University of Rochester is a unique national resource for research and education in science and technology. LLE was established in 1970 as a center for the investigation of the interaction of intense radiation with matter. The National Nuclear Security Administration funds LLE as part of its Stockpile Stewardship Program.

Target being shot by a laser
Users' Guide

LLE Zoom Backgrounds

for virtual meetings are available here.

Quick Shot

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High Power Laser Science and Engineering Paper Named Editor-in-Chief Choice Award

Laser Technology Development Group Leader, Jake Bromage's "Technology Development for Ultraintense All-OPCPA Systems," published in High Power Laser Science and Engineering (HPLSE) was awarded the "2019 Editor-in-Chief Choice Award." This award is bestowed to the author(s) of the best paper of the year as selected by a panel of experts including Editors-in-Chief of HPLSE. The papers are evaluated based on the quality, downloads, citations, and the importance of the work to the field.

Past Quick Shots

COVID-19 Updates

University of Rochester COVID-19 Updates



1 April 2020

Given that we are still in uncertain times in dealing with COVID-19 and the that the safety and health of our employees and their families is paramount, we will delay the restart of general laboratory activities including the Omega Facilities until at least April 15 and most likely beyond. I will continue to update all of you as the situation unfolds.

Be safe,
Mike



LLE Updates

Just Published


Dephasingless Laser Wakefield Acceleration

Dephasingless Laser Wakefield Acceleration by John Palastro et al. was published in Physical Review Letters and chosen as an Editor's Selection and a featured Physics article.

Around the Lab

Measuring the Crystal Structure of HED Materials: X-Ray Diffraction at the Omega Laser Facility

X-ray diffraction (XRD) is a quantitative tool for characterizing a material's atomic structure that exploits the periodicity of atomic arrangements to produce constructive interference of x rays at specific angles scattered from parallel planes of atoms in a sample. Atomic positions within the crystal determine the x-ray peak positions and intensities. The resulting diffraction pattern is the Fourier transform of the electron density distribution and offers critical details about structures, phases, textures, and other structural parameters, such as average grain size, crystallinity, strain, and crystal defects.

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